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Bruker Nabs NIST Contract for AFM

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BERLIN, Germany, April 26, 2010 — Bruker has announced that it has been awarded a $1.1 million contract to supply a customized N8 Titanos large-sample atomic force microscope (AFM) to the National Institute of Standards and Technology (NIST). The instrument will be used by NIST’s Precision Engineering Div. (PED) at its Manufacturing Engineering Laboratory, with a main focus on metrology applications that require traceable AFM (T-AFM). Bruker’s N8 Titanos offers improved spatial resolving power and outstanding mechanical stability for wafer samples up to 300 mm in diameter. (Image: Business Wire) The T-AFM...Read full article

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    Published: April 2010
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    si
    Systeme Internationale d'Unites, the international metric system of units.
    AFMAmericasatomic force microscopeBasic ScienceBrukerBusinesscontractEuropeFrank SaurenbachGermanyHans-Achim FussImagingindustrialInternational System of UnitsManufacturing Engineering LaboratorymetrologyMicroscopyN8 Titanosnanoscale metrologyNational Institute of Standards and TechnologyNISTPhysikalisch-Technische BundesanstaltSi

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