Microscope for FTIR
Jasco Inc. has released a downloadable three-page
document that describes its Irtronμ sample compartment microscopy system, which
is compatible with the company’s FT/IR-4000 and -6000 series Fourier transform
IR spectrometers. It notes that the accessory installs into the spectrometer sample
compartment in seconds without optical alignment and that the optical design provides
high throughput for sensitive measurements of samples approaching 20 μm. The
full-color publication includes graphs depicting transmission measurement using
the mercury-cadmium-telluride and deuterated L-alanine triglycine sulphate detectors.
Optional accessories such as a purge casing, a pressure sensor and attenuated total
reflectance objectives are listed.