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Microscope Records Chemical Makeup

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Robert C. Pini

Researchers at Max Planck Institut fur Biochemie have combined the atomic force microscope's ability to define surface features with the infrared absorption techniques of spectroscopy to record chemical composition. Atomic force microscopy not only imaged the topography of polystyrene in polymethylmethacrylate (left), but also spectrographic information at two IR wavelengths: 9.7 and 10.2 µm (middle and right, respectively). Courtesy of Fritz Keilmann. The hybrid instrument promises imaging results that could benefit research in biology, materials science and electronics,...Read full article

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    Published: August 1999
    Basic SciencechemicalsMicroscopyResearch & TechnologySensors & DetectorsTech Pulse

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