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SPIE Optical Metrology 2011: Call for Papers

CARDIFF, England, Nov. 9, 2010 — New research in optical measurement technologies enabling applications in industry, research modeling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical Metrology 24 to 26 May 2011. The conference will be held at the International Conference Centre...Read full article

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