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FEI Wins Multi-System Order From CANMET

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CANMET Materials Technology Laboratory (CANMET-MTL) has selected three of FEI Co.’s electron microscope systems for its new facility at the McMaster Innovation Park in Hamilton, Ontario.

CANMET-MTL, a research center funded by the Canadian government, has purchased FEI’s Tecnai Osiris scanning/transmission electron microscope (S/TEM), the Helios NanoLab DualBeam, and the Nova NanoSEM ultrahigh resolution scanning electron microscope (SEM).


The Tecani Osiris S/TEM from FEI Co. reduces time for field-of-view elemental mapping from hours to minutes. (Photo: FEI)

The S/TEM combines analytical throughput with ease-of-use for high-volume, multi-user research facilities. Featuring the company’s ChemiSTEM technology, it reduces the time for field-of-view elemental mapping from hours to minutes.

Integrating the company’s high-resolution scanning electron microscope with its high-performance focused ion beam, the Helios NanoLab DualBeam delivers unprecedented levels of imaging and milling capabilities, the company said. It is suitable for research centers that need to perform advanced material characterization and modification down to the single nanometer scale.

The Nova NanoSEM can provide nanometer-scale resolution and ultraprecise analysis on a range of samples. In addition, it can examine highly insulating samples in low vacuum, with up to nearly the same resolution that can be achieved in high vacuum and with little or no preparation, eliminating artifacts and saving time.

The three systems will be shipped the CANMET-MTL during the first quarter of 2011.

For more information, visit: www.fei.com 
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Published: January 2011
Glossary
field of view
The field of view (FOV) refers to the extent of the observable world or the visible area that can be seen at any given moment through a device, such as an optical instrument, camera, or sensor. It is the angular or spatial extent of the observable environment as seen from a specific vantage point or through a particular instrument. Key points about the field of view include: Angular measurement: The field of view is often expressed in angular units, such as degrees, minutes, or radians. It...
milling
An automatic surface-generating process involving the removal of a material from a given surface. Optical milling typically involves the abrasion of glass by a diamond-charged wheel.
nanometer
A unit of length in the metric system equal to 10-9 meters. It formerly was called a millimicron.
scanning electron microscope
An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
transmission electron microscope
A type of microscope that uses magnetic lenses to transmit a beam of electrons through an object; the electrons are then focused on a fluorescent screen to form an enlarged image.
AmericasanalysisartifactBusinessCanadaCANMET Materials Technology LaboratoryCANMET-MTLChemiSTEMelemental mappingFEIFEI Co.FEI companyField of ViewHelios NanoLab DualBeamImagingmaterial characterizationMcMaster Innovation ParkMicroscopymillingmodificationnanometerNova NanoSEMOpticsresearch centerS/TEMscanning electron microscopescanning/transmission electron microscopeSEMTecnai OsirisTEMtransmission electron microscopevacuum

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