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MetaStable Instruments Awarded Thin-Film Metrology Patent
Apr 2012
ST. PETERS, Mo., April 10, 2012 — MetaStable Instruments Inc. has received US Patent No. 8,139,234 for a technique that measures very low absorption in certain thin-film optical coatings that are deposited in a vacuum chamber.

The technique, which helps coaters more quickly minimize the absorption in high-power laser and ultrasensitive optical applications, was developed under a Missile Defense Agency Phase II Small Business Innovative Research contract from the US Air Force Research Laboratory at Wright-Patterson Air Force Base.

It was first demonstrated at Deposition Research Laboratories Inc. of St. Charles, with help from Dr. Arthur Braundmeier of Southern Illinois University Edwardsville.

MetaStable Instruments manufactures patented beam steerers.

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