Search
Menu
BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

WITec Opens Offices in Japan and Spain

Facebook X LinkedIn Email
ULM, Germany, Sept. 4, 2012 — Rapid growth in Europe and Asia has spurred nanoanalytical microscopy systems maker WITec GmbH to open regional offices in Japan and Spain. WITec's office in Japan is located at the Kanagawa Science Park. Head of the new office is Dr. Keiichi Nakamoto, a scanning probe microscopy (SPM) veteran of more than 20 years who led an R&D group at the SPM division of JEOL. The Spain office, located in Barcelona, will primarily serve the Spanish and Portuguese market, the company said. Area manager and office head Dr. Elena Bailo is a former member of the WITec service and support team....Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: September 2012
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    Asia-PacificBusinessconfocalElena BailoEuropeGermanyImagingJapanJoachim KoenenKanagawa Science ParkKeiichi NakamotometrologyMicroscopynanonanoanalyticalphotonics innovationPhotonics MediaPrism AwardRaman imagingscanning probe microscopySpainSPIETest & MeasurementWITec

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.