Search
Menu
Lumencor Inc. - Power of Light 4-24 LB

LSCM and RelA for Quantifying Microwear: A Case Study

Facebook X LinkedIn Email
W. James Stemp, Keene State College; Harry J. Lerner, Laval University; and Elaine H Kristant, Harvard University

Laser scanning confocal microscopy and relative area are effective tools for surface-roughness analysis of experimental Mistassini quartzite scrapers. Laser scanning confocal microscopy (LSCM) and relative area (RelA) are effective tools for the documentation and discrimination of surface roughness on experimental stone tools made from Mistassini quartzite. Together, their ability to effectively document and discriminate wear on these experimental tools offers archaeologists another method for studying past uses of chipped quartzite artifacts. Figure 1. Map of the source location...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: February 2015
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    FeatureslensesmetrologymirrorsLasersOpticsMicroscopyMaterialsLight SourcesAmericaslaser-scanning confocal microscopyLSCMrelative areaRelAsurface roughnesssurface measurementMistassini quartzite scraperF-testatomic force microscopyfocus variation microscopyincident lightmicroelectromechanical resonant galvano mirrorsurface documentationarchaeology toolsDr. W. James StempDr. Harry J. LernerElaine H. KristantLaval UniversityHarvard UniversityKeene State College

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.