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SPIE Recognizes Fraunhofer Metrology Researchers

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BELLINGHAM, Wash., Aug. 12, 2015 — Five researchers from the Fraunhofer Institute for Applied Optics and Precision Engineering (IOF) of Jena, Germany, have received the Rudolf Kingslake Medal and Prize for work on optical metrology. SPIE, the international society for optics and photonics, awards the prize annually to the authors of what it deems the most noteworthy original paper on theoretical or experimental aspects of optical engineering published in its flagship journal, Optical Engineering. Stefan Heist, Peter Kühmstedt, Andreas Mann, Gunther Notni and Peter Schreiber wrote the winning paper, "Array...Read full article

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    Published: August 2015
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    industrialAmericasSPIEFraunhoferIOFmetrologyTest & MeasurementEuropeGermanyStefan HeistPeter KuhmstedtAndreas MannGunther Notni and Peter SchreiberBusiness

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