Search
Menu
Cognex Corp. - Smart Sensor 3-24 GIF LB

Elastic Peak Electron Spectroscopy Theorized for Surface Analysis

Facebook X LinkedIn Email
WARSAW, Poland, July 18, 2016 — A theoretical model describing the sampling depth of elastic peak electron spectroscopy for calculating the parameters of electron scattering in the surface layers of samples may enable more reliable interpretation of measurement data and reduce the time needed for materials analysis. Traditionally, multiple calculations have been required to determine if the electrons reflected from the surface of the material absolutely pertained to the sample being tested, and not, for example, to the base on which the sample was located. Professor Aleksander Jablonski from the Institute of Physical...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: July 2016
    Research & TechnologyEuropespectroscopyBiophotonicsImagingSensors & Detectorseducationelectron backscattering

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.