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Agilent Wins Testing Awards
May 2010
SANTA CLARA, Calif., May 11, 2010 — Agilent Technologies Inc. recently announced that its Medalist i3070 Series 5 in-circuit test solution garnered two major technology awards during the Nepcon Shanghai 2010 trade show in late April. These awards recognize innovation and reliability in improving product quality in today’s mature SMT manufacturing environment.

The i3070 Series 5 was named winner for the test category in both the fourth SMT China Vision awards and the 2010 EM Asia Innovation awards.

In addition, the series was a finalist in both the EDN Innovation 2009 and the Test & Measurement World’s 2010 Best in Test competitions.

The series is Agilent’s latest in-circuit tester. Innovations include its ability to maintain high compatibility, and added features include faster test throughput. A utility card allows users to add custom functionalities through plug-in electronics. According tothe company, the system offers wider and more flexible power management capabilities, and an upgradable path is available for users working on the Agilent 3070 and Medalist i3070 in-circuit testers.

For more information, visit:

AgilentAmericasAsia-PacificBusinessCaliforniaEDN InnovationEM Asia Innovationin-circuit testingindustrialIndustry EventsMedalist i3070 Series 5Nepcon ShanghaiSMT China VisionTest & MeasurementTest & Measurement World

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