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Ametek Acquires Amptek and Luphos

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Ametek Inc., a global manufacturer of electronic instruments and electromechanical devices, has acquired Amptek Inc. and Luphos GmbH.

Amptek provides x-ray detectors that utilize x-ray fluorescence for nondestructive materials analysis.

Luphos provides noncontact metrology technology for nanometer level measurements of complex aspherical lenses and optical surfaces using multi-wavelength laser interferometry.

For more information, visit www.ametek.com.
Perkins Precision Developments - Custom Laser Mirrors MR 4/24

Published: August 2014
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
nano
An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
AmericasAmetek Inc.aspherical lensesBusinessImaginginterferometerslensesmetrologynanoOpticsPennsylvaniaSensors & DetectorsLuphos GmbH

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