Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
More News

Candela Instruments Introduces Automated Surface Inspection System for Optoelectronic Substrates

Facebook Twitter LinkedIn Email Comments
FREMONT, Calif., Aug. 13 -- Candela Instruments announces the availability of an Optical Surface Analyzer (OSA) for substrates used in the manufacture of active and passive optoelectronic devices. The C1 offers a combination of surface inspection and metrology applications, making it a versatile system for substrate qualification, yield improvement or contamination control.
   Available with manual or automated handling for up to 200-mm-diam substrates, the C1 is suitable for use in laboratories, pilot lines or volume manufacturing lines.

Photonics.com
Aug 2001
GLOSSARY
metrology
The science of measurement, particularly of lengths and angles.
industrialmetrologyNews & Features

Comments
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2020 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.