Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Carl Zeiss, Digital Surf Pen Software Agreement

Facebook X LinkedIn Email
Carl Zeiss and Digital Surf have signed an agreement that enables the former company to provide the latter’s ConfoMap surface imaging and analysis software for use with Zeiss’ confocal microscopes.

The software includes numerous analytical studies, including geometric and functional. It can also be extended by adding modules for advanced analyses of surface texture, dimensions, grains and particles, 3-D Fourier and surface evolution.

The software can be used with Zeiss’ Axio CSM 700 confocal microscope, its LSM 700 confocal laser scanning microscope, and with other compound microscopes for topographical research.

Carl Zeiss provides innovative solutions for the medical, research, industrial, and eye care and lifestyle sectors.

Digital Surf provides surface analysis software for all types of metrology instruments, including 2- and 3-D profilometers, and optical and scanning probe microscopes.

For more information, visit: www.zeiss.de  
Zurich Instruments AG - Boost Your Optics 1-24 MR


Published: July 2011
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
BiophotonicsBusinessCarl Zeissconfocal laser scanning microscopeconfocal microscopeConfoMapCSM 700Digital SurfEuropeeye careFranceGermanygrain and particle analysisimaging softwareindustrialLSM 700medicalmetrologyMicroscopyoptical microscopesOpticsprofilometersscanning probe microscopesSoftwaresurface evolution analysissurface imagingsurface imaging and analysis softwaresurface metrologyTest & Measurementtopographical researchLasers

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.