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CyberOptics Continues to Whittle Down Losses

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MINNEAPOLIS, Oct. 24, 2014 — Sensors firm CyberOptics Corp. decreased its net loss in the third quarter thanks in part to the acquisition of a 3-D metrology firm.

Net loss totaled $448,000, compared to $774,000 in the third quarter of 2013. Meanwhile, revenues increased 34 percent, from $8.7 million in the third quarter of 2013 to $11.7 million in the third quarter of this year.

The company credited the March acquisition of Laser Design Inc. with contributing $1.3 million in revenues.

“Since 3-D inspection is the high-growth segment of the electronic assembly, semiconductor and industrial markets, we are strategically repositioning CyberOptics as a developer and manufacturer of high-precision 3-D sensors,” said CEO Dr. Subodh Kulkarni.

He said the company continues to develop multireflection suppression (MRS) 3-D technology, which is intended to aid inspection of ever-smaller circuit components. The company plans to launch an MRS area-of-interest inspection system in the first quarter of next year.

Sales of surface-mount technology (SMT) sensors increased 42 percent from last year’s third quarter, inspection systems sales rose 4 percent and sales of semiconductor products, principally the WaferSense product line, were up 8 percent, the CEO said.

Kulkarni said he expects double-digit sales growth and a reduced loss in the fourth quarter.

For more information, visit www.cyberoptics.com.
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Published: October 2014
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
BusinessAmericasMinnesotaCyberOpticsSensors & Detectorsmetrologyinspection3-D3Dmultireflection suppression

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