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Daily News Briefs
Apr 2003
Agilent Technologies Inc. announced it has launched a Web-based "one-stop shop" for engineers who need electronic design automation (EDA) technical information and support tools. The EEsof Knowledge Center, at, provides technical documents, support examples, software downloads and discussion forums.   . . .   Veeco Instruments Inc. announced that International SEMATECH has installed its new Dimension X3D inline, 3-D lithography atomic force microscope metrology tool for advanced process development and high-volume semiconductor manufacturing. International SEMATECH's lithography and metrology divisions will use the Dimension X3D to characterize 90 nm and smaller device features in photolithography and etch applications, including photomask metrology.   . . .   Minneapolis-based Scanner Technologies Corp., a developer of 3-D device inspection technologies, announced it has begun shipping its new VisionFlex component inspection system.

The science of measurement, particularly of lengths and angles.
Agilent Technologiesatomic force microscopeBasic Scienceelectronic design automationindustrialInternational SematechlithographymetrologyMicroscopyNews BriefsPhotonics Tech BriefsVeeco Instruments

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