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Frederick Mullavey has been named director of quality at Janos Technology Inc., a Townshend, Vt.-based precision optics manufacturer.   . . .   The National Institute of Standards and Technology (NIST) has released a an electronic mass measurement training course to alleviate a training backlog of officials from government and industrial mass calibration laboratories. The free CD-ROM covers NIST’s basic one-week mass metrology courses. It is designed to introduce mass metrology newcomers to the field; as supplementary training for those who have taken a metrology course and want to review their knowledge before entering the laboratory environment; or as a refresher for laboratory staff unfamiliar with the latest measuring techniques. To obtain The Basic Mass Metrology CD-ROM (NIST Special Publication 1001), call NIST at 301-975-4004; E-mail: [email protected]. A Spanish version is under development.   . . .   Zafar Ahmad has been promoted to vice president North America, of Photronics Inc., a photomask manufacturer. Ahmed was previously director of operations at Photronics' Austin facility and has also served as the site director at its Manchester, England, facility.

Published: November 2003
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
industrialJanos TechnologymetrologyNational Institute of Standards and TechnologyNews BriefsOpticsPhotonics Tech BriefsPhotronics

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