Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Email Facebook Twitter Google+ LinkedIn Comments

Daily News Briefs
Dec 2004
Arden L. Bement Jr. was named director of the National Science Foundation (NSF), effective Nov. 24. He had been acting director since February. Bement joined NSF from the National Institute of Standards and Technology, where he had been director since 2001. Before that, he was a professor of nuclear engineering and head of the School of Nuclear Engineering at Purdue University. He was a member of the US National Science Board (NSB) from 1989 to 1995; he will now be an ex officio member. He also chaired the Commission for Engineering and Technical Studies and the National Materials Advisory Board of the National Research Council; was a member of the Space Station Utilization Advisory Subcommittee and the Commercialization and Technology Advisory Committee for NASA; and consulted for the Department of Energy's Argonne National Laboratory and the Idaho National Engineering and Environmental Laboratory. He has been a director of Keithley Instruments Inc. and the Lord Corp. and was a member of the Science and Technology Advisory Committee for Howmet Corp., a division of Alcoa.    . . .    Bruker AXS Inc., a developer of advanced x-ray diffraction systems, and Albany NanoTech, a nanotechnology R&D complex and site of the College of Nanoscale Science and Engineering (CNSE) at the University at Albany, State University of New York, have announced a cooperative agreement for x-ray characterization and metrology. Bruker AXS will provide Albany NanoTech with its D8 Discover for Wafers diffraction tool, which enables the structural characterization of nanolayers from 0.1 to 1000 nm, to analyze semiconductor heterostructures and develop new kinds of nanomaterials.

The science of measurement, particularly of lengths and angles.
Albany NanoTechArden BementBruker AXSmetrologyNational Science FoundationNews BriefsPhotonics Tech Briefs

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA,

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.