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FEI Offers Electron Microscopy Guide

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HILLSBORO, Ore., Oct. 15, 2010 — FEI Co. has released “An Introduction to Electron Microscopy,” an all-new edition of its well-known primer about electron- and ion-beam microscopy. The booklet is available for no charge on the company’s website.

The 40-page booklet is ideal for a student or business professional who would like a view into the world of nanotechnology. It contains a general overview of electron and ion beam microscopes, including the history, technology, terminology and applications of transmission electron, scanning electron, scanning transmission electron, focused ion beam and DualBeam systems. Image examples cover a variety of samples, such as pollen, semiconductors, steel, minerals, blood cells and viruses.

FEI is a diversified scientific instruments company that offers electron- and ion-beam microscopes and tools for nanoscale applications across many industries, including industrial and academic materials research, life sciences, semiconductors, data storage and natural resources. The company’s imaging systems provide 3-D characterization, analysis and modification/prototyping with resolutions down to the sub-Angstrom level.

For more information, visit:
Oct 2010
The use of atoms, molecules and molecular-scale structures to enhance existing technology and develop new materials and devices. The goal of this technology is to manipulate atomic and molecular particles to create devices that are thousands of times smaller and faster than those of the current microtechnologies.
AmericasBusinessdownloadsDualBeamelectron microscopyFEI Co.focused ion beamimagingindustrialion-beam microscopyMicroscopynanonanotechnologypublicationsscanning electronscanning transmission electrontransmission electron

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