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ILSIT Names Committee Members
Nov 2010
OSAKA, Japan, Nov. 15, 2010 — The Institute of LSI Testing (ILSIT) announced recently that DCG Systems and Hamamatsu Photonics have been elected to membership on the ILSIT Organization Committee. Members include technology leaders from Toyota Motors, Renesas Electronics, Oita University, University of Tokyo, Osaka University, Hitachi High-Technology, JOEL Ltd. and Toshiba. DCG and Hamamatsu have been added as the third and fourth vendor on this committee.

ILSIT was founded in 2006 by Koji Nakamae, professor at Osaka University, to sponsor the LSI Testing Symposium (LSITS) and is currently chaired by him. Since 1981, LSITS is recognized as the foremost technical conference in Japan dedicated to the diagnostics and testing of LSI circuits. The conference is held in cooperation with the Institute of Electronics, Information and Communication Engineering, the Japan Society of Applied Physics, Reliability Engineering Association of Japan and Union of Japanese Scientists and Engineers. LSITS brings together engineers and scientists from industries and universities to discuss recent progress and future trends in semiconductor analysis.

The Organization Committee of ILSIT includes a broad range of expertise, including professor Kiyoshi Nikawa (Osaka University), the inventor of “optical beam induced resistance change,” or OBIRCH; Dr. Toshiyuki Majima (Renesas Electronics), the inventor of “electron beam adsorbed current,” or EBAC; and Dr. Toru Koyama (Renesas Electronics), the developer of “FOrming the Si substrate into a solid immersion lens,” or FOSSIL; and seven other technology leaders from industry and academia. DCG’s role on the committee is to promote a greater international presence at the LSITS.

For more information, visit:

Asia-PacificBusinessCaliforniaDCG Systemselectron beam adsorbed currentengineeringHamamatsu PhotonicsHitachi High-TechnologyILSIT Organization CommitteeInstitute of Electronics Information and Communication EngineeringJapanJOEL Ltd.Kiyoshi NikawaKoji NakamaelensesLSI Testing SymposiumOita UniversityOptical Beam Induced Resistance ChangeopticsOsaka UniversityReliability Engineering Association of JapanRenesas Electronicssemiconductorsiliconsolid immersion lenssubstrateTest & MeasurementThe Institute of LSI Testingthe Japan Society of Applied PhysicsToru KoyamaToshibaToshiyuki MajimaToyota MotorsUnion of Japanese Scientists and EngineersUniversity of Tokyo

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