Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

MetaStable Instruments Awarded Thin-Film Metrology Patent

Facebook X LinkedIn Email
ST. PETERS, Mo., April 10, 2012 — MetaStable Instruments Inc. has received US Patent No. 8,139,234 for a technique that measures very low absorption in certain thin-film optical coatings that are deposited in a vacuum chamber.

The technique, which helps coaters more quickly minimize the absorption in high-power laser and ultrasensitive optical applications, was developed under a Missile Defense Agency Phase II Small Business Innovative Research contract from the US Air Force Research Laboratory at Wright-Patterson Air Force Base.

It was first demonstrated at Deposition Research Laboratories Inc. of St. Charles, with help from Dr. Arthur Braundmeier of Southern Illinois University Edwardsville.

MetaStable Instruments manufactures patented beam steerers.

For more information, visit: www.metastableinstruments.com  
Deposition Sciences Inc. - Difficult Coatings - MR-8/23


Published: April 2012
Air Force Research LaboratoryAmericasArthur BraundmeierCoatingsdefenseDeposition Research Laboratorieslow absorption measurementMetaStable InstrumentsMissile Defense Agency Phase IIMissouriOpticsSBIR contractSouthern Illinois UniversityTest & Measurementthin-film optical coatingsUS Patent No. 8139234Wright-Patterson Air Force BaseLasers

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.