Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
More News

Near-Field Microscopy Maps Nanoscale Material Compositions

Facebook Twitter LinkedIn Email Comments
Far-field microscopy techniques typically cannot map different types of materials on multicomponent nanostructures because the associated wavelength limit causes blurring of the image.
Researchers at the Max Planck Institut für Biochemie in Martinsried, Germany, have developed a method to distinguish the three main constituents of nanosystems -- metals, semiconductors and dielectrics -- by combining tapping-mode atomic force microscopy with an optical scattering probe to simultaneously map the optical response and tomography of a system.

As reported in the Jan. 7 issue of Applied Physics Letters, the method suppresses background interference by demodulating the detector signal at a harmonic of the microscope's tapping frequency -- thus providing measurements of refractive indices, linked to the different types of materials, at topological resolutions down to 10 nm.

Photonics Spectra
Apr 2002
Basic ScienceMicroscopyResearch & TechnologySensors & DetectorsTech Pulse

Comments
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2019 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.