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PW10: Variety at Edmund Optics
Jan 2010
Laura S. Marshall

SAN FRANCISCO, Jan. 29, 2010 – Flexibility was a recurring theme among exhibitors at SPIE Photonics West this year, and Edmund Optics (EO) was no exception: The Barrington, N.J.-based company had a large number of new and recent products on display, including hands-on demonstrations designed to show attendees the various ways in which EO components can be combined.

Project Manager Adam Bublitz noted that Edmund has been focusing on biotech optics, investing in new asphere technology and developing hybrid and plastic aspheres for biophotonic applications.

From C-Mount components for dental imaging systems to reflective objectives that use mirrors instead of lenses, Edmund showed off its products and their wide range of uses.

EO’s TechSpec adjustable ReflX objectives are the company’s “best new product,” according to Kirsten Bjork-Jones, marketing manager. “This is a very unique product for us.” The objectives cut out chromatic aberration and material absorption problems found with standard microscope objectives, making them useful for UV or IR applications such as FTIR spectroscopy, semiconductor inspection, ellipsometry and photolithography. “Everybody services the visible,” said David Henz, product manager for anchor optics. “We’re focusing on the IR.”

Recent releases, TechSpec Hard-Coated Bandpass Interference Filters also made an appearance at the show. These filters come in center wavelengths from 405 to 980 nm and offer a 10 nm bandwidth. High-precision applications for these filters include biotech, biomedical and quantitative chemical applications such as clinical chemistry, environmental testing, colorimetry, elemental and laser line separation, flame photometry, fluorescence and immunoassays, and more. Their dense coating prevents filter degradation, Henz noted.

Also available for demonstration were F-Theta Scanning Lenses, designed for Nd:YAG (1064 nm, 532 nm and 355 nm) and CO2 (10.6 µm) laser sources. Laser marking, engraving and cutting systems are some of their intended applications.

Laura S. Marshall  

A standard lens interface initially made for 16mm movie cameras and now used primarily on closed-circuit television cameras. It is a 1-in.-diameter, 32-thread-per-inch interface with a flange-to-image plane distance of 0.69 in.
chromatic aberration
The lens aberration resulting from the normal increase in refractive index of all common materials toward the blue end of the spectrum. The change in image size from one color to another is known as lateral color or chromatic difference of magnification.
The methods used to measure color and to define the results of the measurements.
The measurement of the change in ellipticity of an optically polarized light beam after reflection from a surface in a particular manner.
flame photometry
A part of the spectrochemical analysis of a sample that deals with the excitation of that sample by flame analysis.
The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
A lithographic technique using an image produced by photography for printing on a print-nonprint, sectioned surface.
Adam BublitzAmericasasphere technologyaspheresBasic ScienceBiophotonicsbiotecbiotech opticsBjork-JonesBublitzC-mountchromatic aberrationclinical chemistryCO2 laser sourcescolorimetryDavid Henzdental imagingdeveloping hybrid aspheresEdmundEdmund Opticselemental and laser line separationellipsometryenvironmental testingF-ThetaF-Theta Scanning Lensesfilter degradationFiltersflame photometryfluorescenceFTIR spectroscopyHenzimmunoassaysindustrialIR applicationsKirsten Bjork-Joneslaser cuttinglaser engravinglaser markingLaura S. Marshalllensesmaterial absorptionMicroscopymirrorsNd:YAG laserobjectivesopticsphotolithographyPhotonics Westplastic aspherespw10reflective objectivesReflXsemiconductor inspectionSPIE Photonics West 2010TechspecTechSpec Hard-Coated Bandpass Interference FiltersUV

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