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4D Awarded for PhaseCam

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TUCSON, Ariz., June 6 -- 4D Technology Corp., a Tucson, Ariz., manufacturer of vibration-insensitive dynamic noncontact surface metrology interferometer systems/software, announced today that its PhaseCam 4010-MW was selected as a recipient of a 2005 R&D 100 Award by R&D Magazine. 4D received a 2004 R&D 100 Award for its FizCam 1000, a Fizeau interferometer configuration. The PhaseCam 4010-MW is a polarization-based Twyman Green dynamic multiple wavelength interferometer. Its development required the invention of an achromatic, high-speed phase sensor and a high-accuracy, relative wavelength...Read full article

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    Published: June 2005
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    2005 R&D 100 Award4D TechnologyindustrialmetrologyNews & FeaturesPhaseCam 4010-MWSensors & Detectorssurface metrology interferometervibration-insensitive

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