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Agilent to Present at NanoTech

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W. Travis Johnson, life sciences applications manager at Agilent Technologies Inc., will present a paper on innovative techniques for using scanning probe microscopes (SPMs) and atomic force microscopes (AFMs) in the study of biological phenomena, tomorrow at 4 p.m. at Nanotech 2006, being held this week in Boston. Johnson will discuss TREC (topography and recognition) -- an SPM/AFM imaging mode that combines molecular-scale imaging with the sensitivity of a piconewton-scale single molecule biosensor.  Agilent's PicoTREC imaging system (developed by Molecular Imaging Corp., which Agilent...Read full article

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    Published: May 2006
    AFMsAgilent Technologiesatomic force microscopesBasic ScienceMicroscopyNanotech 2006News BriefsPhotonics Tech Briefsscanning probe microscopesSensors & DetectorsSPMsW. Travis Johnson

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