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Back-Illuminated Image Sensors Come to the Forefront

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Novel materials and fabrication methods increase quality and lower cost of sensors for machine vision and industrial imaging.

Dr. P.K. Swain and David Cheskis, Sarnoff Corp.

Demand for higher throughput inspection systems with improved resolution is growing in the machine vision and industrial imaging industries. Traditionally, front-illuminated CCD or CMOS sensors are used in these inspection systems because of the lower costs associated with their high-volume manufacturing compatibility. To keep up with the increased demand, while remaining sensitive to cost constraints, manufacturers are forced to reduce the pixel size — limiting the performance of image sensors. To solve this problem, sensor manufacturers are turning to back illumination. Back-illuminated...Read full article

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