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Chaos Affects Atomic Force Microscopes

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Daniel S. Burgess

A pair of researchers at Purdue University in West Lafayette, Ind., have confirmed suspicions that deterministic chaos plays a role in dynamic atomic force microscopy (AFM) systems, introducing small but real uncertainty into the measurements. Although the consequences of the effect can be ignored for most applications of AFM, Arvind Raman and Shuiqing Hu note that they must be acknowledged as nanometrology advances. Deterministic chaos is a source of error in dynamic atomic force microscopy (AFM). With the transition from the period-1 oscillation state in the noncontact regime to the...Read full article

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    Published: April 2006
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    Basic Sciencedynamic atomic force microscopyFeaturesmetrologyMicroscopyPurdue University

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