WARSAW, Poland, July 18, 2016 — A theoretical model describing the sampling depth of elastic peak electron spectroscopy for calculating the parameters of electron scattering in the surface layers of samples may enable more reliable interpretation of measurement data and reduce the time needed for materials analysis. Traditionally, multiple calculations have been required to determine if the electrons reflected from the surface of the material absolutely pertained to the sample being tested, and not, for example, to the base on which the sample was located. 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PAS is inherently insensitive to reflection or scattering from...COMPANIESOZ Optics LimitedEstablished in 1985, OZ Optics is a leading worldwide supplier of fiber optic components, test equipment and sensors. OZ Optics manufactures its products in three locations, Ottawa (Canada),...Photonics Buyers' GuideCascade Optical CorporationCascade Optical Corporation has more than 35 years of expertise in custom vacuum-deposited thin-film coatings, specializing in IAD, low temp, low stress coatings for laser crystals and fiber optics....Photonics Buyers' GuideLambda Research Optics Inc. (USA)Lambda Research Optics, Inc. is a leading manufacturer of laser optics with high power thin-film coatings and high precision fabrications. Lambda serves a wide range of industries, such as Biotech,...Photonics Buyers' GuideSmarAct Inc.Since 2005, SmarAct develops piezo-based, high-performance positioners and measurement tools for the micro- and nanometer scale. 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