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Elastic Peak Electron Spectroscopy Theorized for Surface Analysis

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WARSAW, Poland, July 18, 2016 — A theoretical model describing the sampling depth of elastic peak electron spectroscopy for calculating the parameters of electron scattering in the surface layers of samples may enable more reliable interpretation of measurement data and reduce the time needed for materials analysis. Traditionally, multiple calculations have been required to determine if the electrons reflected from the surface of the material absolutely pertained to the sample being tested, and not, for example, to the base on which the sample was located. Professor Aleksander Jablonski from the Institute of Physical...Read full article

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