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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Extended Aspheric Measurement Capability with Subaperture Stitching Interferometry

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The technique couples precise computer-controlled motions with advanced software algorithms to provide full measurements of optical surfaces with either large clear apertures, high numerical apertures or both.

Andrew Kulawiec, PhD, QED Technologies, Rochester, N.Y., USA

Subaperture stitching interferometry (SSI) has been proved to be an invaluable tool for today’s modern optics shop. Benefits include high spatial resolution and automatic calibration of reference wavefront errors. This method has been extended to the measurement of aspheric surfaces through the use of even more advanced stitching methods. Recent developments have increased the aspheric departure capability of this tool to more than 200 waves from best-fit sphere through the use of increased optical magnification and improved calibration algorithms. Subaperture stitching was developed...Read full article

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    Published: August 2008
    Europehigh spatial resolutionNews BriefsPhotonics Tech BriefsSubaperture Stitching InterferometryTest & Measurementwavefront errors

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