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FEI, CEA-Leti Team on Semiconductor Tech

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HILLSBORO, Ore., and GRENOBLE, France, Feb. 24, 2011 — Oregon-based scientific instruments maker FEI and CEA-Leti, a French government-funded technological research organization, signed a three-year agreement to characterize advanced semiconductor materials for the 22-nm technology node and beyond, the companies announced this week. CEA-Leti, working with its partners on the MINATEC micro- and nanotechnology innovation campus based in Grenoble, will apply its expertise in holography to improve the sensitivity of dopant profiling, while FEI will provide advanced nanobeam diffraction technology to measure changes in strain and other...Read full article

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    Published: February 2011
    Glossary
    holography
    Holography is a technique used to capture and reconstruct three-dimensional images using the principles of interference and diffraction of light. Unlike conventional photography, which records only the intensity of light, holography records both the intensity and phase information of light waves scattered from an object. This allows the faithful reproduction of the object's three-dimensional structure, including its depth, shape, and texture. The process of holography typically involves the...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    22-nmAmericasBusinessCEA-Leticrystallographicdopant profilingEuropeFEIFranceholographyImagingMicroscopyMINATECnanonanobeam diffractionResearch & TechnologyS/TEMsemiconductorsstrain measurementTest & MeasurementTitan scanning transmission electron microscopeUS

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