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Hot Tip Leads to Nifty Lithography Technique

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ATLANTA, July 20, 2011 — Writing circuits and other tiny structures onto flexible plastic substrates could become more practical with a technique developed by researchers at Georgia Institute of Technology. The method could facilitate high-density, low-cost production of complex ferroelectric structures for energy-harvesting arrays, sensors and actuators in nanoelectromechanical systems (NEMS) and microelectromechanical systems (MEMS). Dubbed thermochemical nanolithography, the technique uses a heated atomic force microscope (AFM) tip to produce patterns, allowing the fabrication of nanometer-scale...Read full article

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    Published: July 2011
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    microelectromechanical systems
    Refers to micron-size complex machines that have physical dimensions suitable for the fabrication of optical switches for use in state-of-the-art communications networks.
    AFMAmericasatomic force microscopeBasic ScienceCMOSElectronics & Signal AnalysisElisa Riedoenergy-harvesting arraysferroelectric structuresflexible plastic substratesGeorgiaGeorgia Institute of Technologygreen photonicsImagingindustrialMEMSmicroelectromechanical systemsMicroscopynanoelectromechanical systemsNazanin Bassiri-GharbNEMSResearch & TechnologySensors & DetectorsSuenne Kimthermochemical nanolithographyUniversity of Illinois Urbana-ChampaignUniversity of Nebraska

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