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Imaging Diagnoses Complex Chips

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Aaron J. Hand

Today's typical microprocessor is a complex creature. The continuing trend toward faster, smaller and denser CMOS circuits does not help engineers measure a chip's signals for possible defects. Traditional inspection methods, which involve probing the device, face difficulties as processor technologies advance. Researchers at IBM's T.J. Watson Research Center have a solution that would allow inspection by examining infrared light through the back of the processor. The fact that it has become common to mount microprocessors face down makes probing even more problematic and this new method that...Read full article

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    Published: May 1998
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