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Jmar Awarded $3.1M to Merge X-Ray Masks, Nanolithography

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SAN DIEGO, Calif., Aug. 16, 2006 -- Jmar Technologies Inc. has received a $3.1 million award from the Naval Air Systems Command (NAVAIR) to continue development of sub-100-nm feature x-ray masks and next-generation nanolithography, to be added to its current $17.5 million contract. Jmar will use its patented x-ray stepper and point source technologies to develop x-ray masks for fabrication of high-speed C-RAM with 50 to 35 nm features, enabling 16 MB and higher densities for high-priority military and space applications. Three Jmar x-ray lithography (XRL) stepper systems will be used in the development of these and...Read full article

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    Published: August 2006
    defenseindustrialJmarJmar TechnologiesnanolithographyNAVAIRNaval Air Systems CommandNews & Featuressub-100nm feature x-ray masksX-Ray Mask

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