Micromembrane Probe Improves Atomic Force Microscopy

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Daniel S. Burgess

A significant advance in atomic force microscopy (AFM) is at hand, thanks to a new type of probe that enables the acquisition of data on dynamic molecular interactions and the simultaneous collection of information about various material and surface properties. The probe is suitable for immediate use in existing AFM systems, and it may enable various novel imaging applications in fields from microelectronics to the biological sciences. The new atomic force microscope probe incorporates an aluminum micromembrane. Tip displacement is detected by monitoring changes in the intensity of...Read full article

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    Published: April 2006
    atomic force microscopyBasic ScienceFeaturesmicroelectronicsMicroscopymolecular interactionsSensors & Detectors

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