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NIST Selects JEOL Microscope for Federal Facility

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PEABODY, Mass., Sept. 22, 2010 — The National Institute of Standards and Technology (NIST) placed an order for JEOL’s atomic resolution analytical JEM-ARM200F transmission electron microscope (TEM) through a competitive award process and funded by the American Recovery and Reinvestment Act. The TEM will be a featured instrument in the NIST Precision Measurement Laboratory in Boulder, Colo. “We are very excited to be partnering with this premier federal government facility and are confident the opportunity will recognize the high performance capability of this new TEM platform,” said Peter...Read full article

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    Published: September 2010
    Glossary
    aberration
    A departure from ideal paraxial imaging behavior. The distortion of an optical field wavefront as it is propagated through the elements of an optical system. The field distortion is due to the interaction of the wavefront with ideal components and therefore a result of optical component behavior.
    optical
    Pertaining to optics and the phenomena of light.
    transmission electron microscope
    A type of microscope that uses magnetic lenses to transmit a beam of electrons through an object; the electrons are then focused on a fluorescent screen to form an enlarged image.
    aberrationaberration correctionAmerican Recovery and Reinvestment actAmericasanalytical instrumentARM200Fatomic resolutionBasic ScienceBusinesselectron microscopeselectron optical equipmentfederal government facilityindustrialJEM-ARM200FJEOLJEOL USAMicroscopyNational Institute of Standards and TechnologyNISTopticalOpticsPeter GenovesePrecision Measuremnet LaboratoryS/TEMsemiconductorsTEMTEM platformtransmission electron microscope

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