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Procedure Produces Sharper AFM Probes

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JENA, Germany, Nov. 2, 2010 — Scientists from Friedrich-Schiller-University Jena were successful in improving a fabrication process for atomic force microscopy (AFM) probe tips. Stephanie Hoeppener is working with an atomic force microscope for which a Jena research team has developed a procedure to produce sharper probes. (Images: Jan-Peter Kasper/University Jena) AFM is able to scan surfaces so that even tiniest nanostructures become visible. Knowledge about these structures is important, for instance, for the development of new materials and carrier systems for active substances. The size of the probe is...Read full article

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    Published: November 2010
    Glossary
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    AFMatomic force microscopyBasic Sciencecarbon nanotubescobaltEuropeFriedrich Schiller UniversityGermanyImagingJenaMicroscopymicrowave radiationnanoNano SciencenanosciencenanotubesOpticsprobe tipsprobesResearch & Technologyscanning force microscopyscanning probesSFMStephanie HoeppenerTamara DruzhiniaUlrich S. Schubert

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