Rochester Institute of Technology in New York has been awarded $1.2 million by the National Science Foundation to develop, fabricate and test a family of detectors grown on silicon wafer substrates by Raytheon Vision Systems of Waltham, Mass. Cheaper, larger and better infrared detectors grown on silicon wafers could give more scientists access to infrared astronomy and further spur the hunt for exoplanets and the study of the universe’s acceleration. Closer to home, the same technology could advance remote sensing and medical imaging.