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SPIE's 46th Annual Meeting Opens

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SAN DIEGO, July 31 -- SPIE's 46th Annual Meeting and International Symposium on Optical Science and Technology opened this week in San Diego. SPIE's Director of Corporate Services, Scott Walker, told Photonics.com that 5000 scientists, engineers and industry executives from more than 45 countries are expected to attend.    The Annual Meeting and Symposium will be highlighted by 2500 technical papers, 70 engineering short courses and a technical exhibit in which more than 240 companies will be showcasing the latest photonics technology. According to Walker, the exhibit will feature products...Read full article

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    Published: July 2001
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    CommunicationsmetrologySPIEs 46th Annual Meeting Opens

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