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Scanning Near-Field Optical Microscopy: Characterizing Nanostructures

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In applications as diverse as waveguide and quantum-dot analysis, this technique offers resolution beyond that possible with conventional confocal microscopy.

Andreas Frank

As design rules for technologies used in applications as diverse as materials research and advanced data storage rapidly approach nanometer size, the hunt is on for simple and effective methods to characterize nanostructures. The ideal would be a high-resolution microscopy technique offering easy-to-interpret optical images; however, light’s diffraction limit presents a stumbling block to enhanced resolution. Even confocal microscopy is unable to overcome this limit, which imposes effective resolution in the 150-nm range. One possible solution is scanning near-field optical...Read full article

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    Published: December 2002
    Basic ScienceFeaturesindustrialMicroscopySensors & Detectorsspectroscopy

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