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BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

Surface Plasmons Imaging Much Easier Than First Thought

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LOUVAIN, Belgium, June 7, 2011 — An unusual observation turned into a breakthrough when researchers at Katholieke Universiteit Leuven discovered that surface plasmons leave imprints on the surface of the nanostructures. The result is expected to lead to a new type of high-resolution microscopy for imaging the electric fields of nanostructures. Surface plasmon patterns can be imprinted on metallic nanostructures for subsequent high-resolution imaging with standard surface probe techniques. Nanomaterials tend to acquire unexpected properties, and optical nanomaterials have quickly become a hot topic in materials...Read full article

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    Published: June 2011
    Glossary
    scanning electron microscopy
    Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
    atomic force microscopyBasic ScienceEuropeImagingKatholieke Universiteit Leuvenmaterials scienceMicroscopynanostructuresoptical nanomaterialsPhysical Review LettersResearch & Technologyscanning electron microscopysurface plasmonsVentsislav K. ValevYogesh Jeyaram

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