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Visa Snafus Stifle Standards Input

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WASHINGTON, Jan. 5 -- Concerns that technical experts from China have been denied entry visas to the US for attendance at technical committee meetings of the International Electrotechnical Commission (IEC) or the International Organization for Standardization (ISO) has prompted action by the American National Standards Institute, or ANSI. The institute has launched outreach efforts at the US Department of State to investigate recent reports that entry visas were denied for some, but not all, Chinese delegates to IEC and ISO technical meetings. Though information does indicate that obtaining...Read full article

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    Published: January 2005
    American National Standards InstituteANSIentry visasIECInternational Electrotechnical CommissionInternational Organization for StandardizationISONews & Featurestechnical meetings

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