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Renishaw plc-Spectroscopy Products Div.

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NSOM/AFM-100 Confocal/RM Series Raman Microscope

Renishaw plc's NSOM/AFM-100 Confocal/RM Series Raman MicroscopeThis instrument, a collaborative effort between Renishaw plc of Wotton-under-Edge, UK, and Nanonics Imaging Ltd. of Jerusalem, combines the chemical sensitivity of Raman spectroscopy with the ultrahigh spatial resolution of scanning probe, atomic force and near-field optical microscopy.

The companies devised this microscope to meet the demands that have arisen as the developments in nanotechnology have grown and the need to probe smaller samples has increased. The NSOM/AFM-100 Confocal/RM series Raman microscope improves the resolution of conventional optical microscopes by five times, to 100 nm, and has the potential to extend Raman spectroscopy to below 50 nm.

The system operates in two modes. AFM/Raman enables users to view surface topography and structures to monitor changes that are not visible with conventional light microscopy, while simultaneous Raman data provide chemically specific molecular and structural information. NSOM/Raman mode breaks the diffraction-limited spatial resolution for Raman spectroscopy coupled to a conventional microscope to offer users ultrahigh-resolution data for scanning probe and Raman techniques.

Previously, using both methodologies meant transfer of the sample between instruments, and locating the exact region analyzed by the Raman microscope when imaging with the selected scanning probe microscopy (SPM) technique was virtually impossible. Now simultaneous Raman spectroscopy and SPM can be done on the same instrument.

Photonics Spectra
Jan 2003
raman spectroscopy
That branch of spectroscopy concerned with Raman spectra and used to provide a means of studying pure rotational, pure vibrational and rotation-vibration energy changes in the ground level of molecules. Raman spectroscopy is dependent on the collision of incident light quanta with the molecule, inducing the molecule to undergo the change.
atomic forceBasic ScienceFeaturesMicroscopynear-field optical microscopyRaman spectroscopyscanning probe

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