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SEM Basics

Photonics Spectra
Jan 2010
JEOL Ltd. has released a 31-page publication titled SEM: Scanning Electron Microscope A to Z: Basic Knowledge for Using the SEM. Available for download on the JEOL USA Web site, the booklet covers the basic operating principle of the microscope as well as image display, the role of secondary and backscattered electron detectors, and the vacuum system. Other topics, such as the edge effect and the influence of accelerating voltage, also are considered.

BreakthroughMediaelectron detectorsimagingJEOL Ltd.MicroscopyNew Mediascanning electron microscopeSensors & DetectorsTest & Measurement

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