Si-Ware Awarded SEMI European MEMS and Sensor Award

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LOS ANGELES, Oct. 26, 2017 — Integrated circuit and microelectromechanical systems-based solutions provider Si-Ware Systems was awarded the SEMI Technology Showcase Award at the 2017 SEMI European MEMS and Sensor Summit in Grenoble, France.

Conference participants voted to confer the award on Si-Ware’s NeoSpectra Micro, the first spectrometer-on-a-chip designed for mobile devices and fixed equipment. Delivering the same functionality as conventional benchtop spectrometers in labs, the integrated NeoSpectra Micro offers end-users quick anywhere/anytime quantification of composition, detection of impurities, and quality control, speeding analysis of samples from days to minutes. The product relies on micro-electromechanical mirrors and the NIR light spectrum to create a sensor that eliminates the need to send samples to a lab and provides accurate, actionable data in the field, the plant floor and even within consumer applications.

The award and conference, organized by SEMI’s strategic association partner the MEMS and Sensors Industry Group, is offered each year for companies engaged in a range of sectors, from Internet of Things and consumer electronics to robotics and biomedical equipment.

“Having a low-cost, miniaturized NIR spectral sensor opens the door for a new wave of usage models that can make spectral scanning ubiquitous,” said Bassam Saadany, optical MEMS business unit manager at SWS. “Receiving this award from the conference audience is a demonstration of how many people see the benefits of NeoSpectra Micro in bringing rapid material analysis to more sectors — and even to consumers, enabling accelerated analysis, measurement and quality control for many applications. Si-Ware would like to thank SEMI, MSIG and the conference audience for their vote of confidence.”

Si-Ware Systems is an independent fabless semiconductor company that focuses on silicon.

Published: October 2017
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