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Sick to Host Free Forum in Cincinnati

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MINNEAPOLIS, Minn., June 14, 2010 — SICK announced Thursday that it will offer free seminars designed to help attendees at its forum to reduce costs, increase productivity and enhance safety.

The sensors, safety systems, machine vision and automatic identification products manufacturer will host the 2010 Sick Solutions Forum June 23 in Cincinnati, Ohio, at the Cincinnati Marriot North Union Center.

Attendees will be given the opportunity to take part in hands-on product demonstrations, as well as in-depth application and technology information seminars.

The company’s forums are schedules throughout the year in many locations across the US and Canada. At each event, attendees can select up to six out of 20 hour-long seminars. Topics range from “Six Steps to a Safe Machine,” to 3-D Machine Vision for the Factor Floor.”

For more information, visit:
Jun 2010
machine vision
Interpretation of an image of an object or scene through the use of optical noncontact sensing mechanisms for the purpose of obtaining information and/or controlling machines or processes.
1. A generic term for detector. 2. A complete optical/mechanical/electronic system that contains some form of radiation detector.
3-DAmericasautomatic identificationBusinessCanadaCincinnatiCincinnati Marriot North Union Centerfactor floorforumidentification productsimagingmachine visionNorth Americaproductivitysafe machinesafetyseminarsensorSensors & DetectorsSickSick Solutions ForumTest & Measurementthree-dimensionalUS

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