Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn Comments

Tamar Garners NSF Funding

Photonics Spectra
Jun 2008
Tamar Technology of Newbury Park, Calif., has been awarded a Phase II grant from the National Science Foundation of Arlington, Va., to continue researching a technology for measuring the thickness of semiconductor wafers and the depth of deep and narrow etched trenches. The company will focus on the development and commercialization of an IR-based confocal sensor that will support rapid single-point thickness measurements of silicon wafers with a small measurement region. The sensor is expected to increase the speed of wafer inspection and to improve yield and process control by providing near-real-time process feedback.


BusinessIR-based confocal sensorlight speedsemiconductor wafersSensors & DetectorsTamar Technology

Comments
Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.