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Technology Doubles Oscilloscope Bandwidth up to 60 GHz
May 2010
CHESTNUT RIDGE, N.Y., May 3, 2010 — Serial data test solutions provider LeCroy Corp. announced that the sixth-generation of digital bandwidth interleave (DBI) technology has been demonstrated successfully in its design labs in New York.

The latest generation of technology will use new front-end chips to provide lower noise and higher bandwidths. Combining new silicon and improved DBI techniques can produce low-noise digital oscilloscopes with true analog bandwidths up to 60 GHz, double the capabilities of the company’s current bandwidth performance of 30 GHz.

Development efforts for the new technology have begun and are expected to yield a pipeline of high-end products over the next two years, said the company.

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The unwanted and unpredictable fluctuations that distort a received signal and hence tend to obscure the desired message. Noise disturbances, which may be generated in the devices of a communications system or which may enter the system from the outside, limit the range of the system and place requirements on the signal power necessary to ensure good reception.
A system in which a supplied signal causes the deflection of the electron beam in a cathode-ray tube, thus forming a visible trace on the phosphor screen of the tube and providing for examination of signal characteristics. A CRT oscilloscope is particularly convenient for studying repetitive phenomena, but a tube with a long-delay phosphor can be used to analyze a single electrical pulse. An oscilloscope equipped with a camera becomes an oscillograph.
In image processing and elsewhere, generally an adjective to describe an assembly-line arrangement for performing a task. For example, an image is put through one kind of processing step and then passed serially through others until the steps are completed.
60 GHzAmericasbandwidthBusinessDBIdigital bandwidth interleavedouble bandwidthfront-end chipshigh-endLeCroy Corp.New YorknoiseoscilloscopepipelineResearch & Technologyserial datasiliconTest & Measurement

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