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Veeco Buys Atomic Force Microscope Probe Unit

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WOODBURY, N.Y., June 10 -- Veeco Instruments Inc. has purchased the atomic force microscope (AFM) probe business of NanoDevices Inc., based in Santa Barbara, Calif. Terms of the transaction were not disclosed.

Don Kania, PhD, president of Veeco, said, "This strategic technology acquisition will help Veeco provide its customers with probes designed specifically to maximize the performance of Veeco's AFMs, and will accelerate our development of new AFM products where innovative probe technology can be the critical element."

Stephen Minne, president of NanoDevices, added, "Veeco has been an important partner for NanoDevices since our founding in 1998, and this acquisition is a natural next step for both sides. By aligning our probe R&D with Veeco's instrument development, we will bring new and novel systems to market quicker, benefiting our research customers."

Veeco Instruments Inc. develops products for nanoscale applications in the semiconductor, data storage, telecommunications/wireless and scientific research markets. Its metrology products are used to measure at the nanoscale, and its process equipment tools help create nanoscale devices.

NanoDevices supplies advanced probes in atomic force microscopy and a variety of calibration artifacts for the nanometer scale.

For more information, visit: www.veeco.com

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Published: June 2003
Glossary
atomic force microscope
An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
AFMatomic force microscopeatomic force microscope probesBasic ScienceCommunicationsmetrologyMicroscopynanodevicesNews & FeaturesVeeco Instruments

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