Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
More News

Veeco Wins $3 Million Metrology Orders

Facebook Twitter LinkedIn Email Comments
WOODBURY, NY, Jan. 16 -- Veeco Instruments Inc. has received approximately $3 million in orders for its Oasis 3000 defect inspection system from three leading manufacturers of thin film magnetic heads.

The Oasis 3000 DUV (deep ultraviolet) provides automatic identification and characterization of defects and automatic measurement of pole tip critical dimensions to 100nm. The system is used in current 40 GB programs and will be required for future 60 GB applications. The Oasis provides 248 nm DUV illumination and imaging to measure writer widths to 100 nm and to quantify other critical dimension measurements such as writer height and shield thickness with nanometer accuracy.


Photonics.com
Jan 2002
News & Features

Comments
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2019 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.