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Zeiss Marks CrossBeam’s 10th Anniversary
Nov 2011
PEABODY, Mass., Nov. 30, 2011 — Carl Zeiss Microscopy, a Carl Zeiss Group company, recently celebrated the 10th anniversary of its CrossBeam FIB-SEM (focused ion beam-scanning electron microscope) technology.

The ceremony was held at the Center for Composite Materials at the University of Delaware, which has acquired an Auriga 60 CrossBeam workstation for its Interdisciplinary Science and Engineering Laboratory, currently under construction. When completed, the lab will provide nearly 200,000 sq ft of space for hands-on research and education.

The Auriga includes both a Gemini SEM and an FIB column. The SEM column enables the Auriga to create high-resolution, nanoscale images, while the FIB column allows it to remove material from the sample by ion milling. A 3-D model of the sample can be created by automatically combining several images. The instrument also can be used to deposit material to the sample by means of various precursor gases.

The device also is suitable for applications including life sciences research, chemical composition analysis, crystallographic orientation and electrical attributes.

For more information, visit:  

AmericasAuriga 60 CrossBeam workstationBusinessCarl Zeiss GroupCarl Zeiss MicroscopyCenter for Composite Materialschemical composition analysisCrossBeam FIB-SEMcrystallographic orientationelectrical attributesFIB-SEMfocused ion beam-scanning electron microscopeGemini SEMhigh-resolution imagingimagingInterdisciplinary Science and Engineering Laboratoryion millingISE Lablife sciences researchMassachusettsMicroscopyUniversity of Delaware

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